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Proceedings Paper

Study and optimization of key parameters of a laser ablation ion mobility spectrometer
Author(s): Kai Ni; Jianan Li; Binchao Tang; Yuan Shi; Quan Yu; Xiang Qian; Xiaohao Wang
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Paper Abstract

Ion Mobility Spectrometry (IMS), having an advantage in real-time and on-line detection, is an atmospheric pressure detecting technique. LA-IMS (Laser Ablation Ion Mobility Spectrometry) uses Nd-YAG laser as ionization source, whose energy is high enough to ionize metal.

In this work, we tested the signal in different electric field intensity by a home-made ion mobility spectrometer, using silicon wafers the sample. The transportation of metal ions was match with the formula: Td = d/K • 1/E, when the electric field intensity is greater than 350v/cm. The relationship between signal intensity and collection angle (the angle between drift tube and the surface of the sample) was studied. With the increasing of the collection angle, signal intensity had a significant increase; while the variation of incident angle of the laser had no significant influence. The signal intensity had a 140% increase when the collection angle varied from 0 to 45 degree, while the angle between the drift tube and incident laser beam keeping the same as 90 degree. The position of ion gate in LA-IMS(Laser Ablation Ion Mobility Spectrometry) is different from the traditional ones for the kinetic energy of the ions is too big, if the distance between ion gate and sampling points less than 2.5cm the ion gate will not work, the ions could go through ion gate when it closed. The SNR had been improved by define the signal when the ion gate is closed as background signal, the signal noise including shock wave and electrical field perturbation produced during the interaction between laser beam and samples is eliminated when the signal that the ion gate opened minus the background signal.

Paper Details

Date Published: 9 November 2016
PDF: 10 pages
Proc. SPIE 10016, High-Power Lasers and Applications VIII, 100161Z (9 November 2016); doi: 10.1117/12.2246634
Show Author Affiliations
Kai Ni, Tsinghua Univ. (China)
Jianan Li, Tsinghua Univ. (China)
Binchao Tang, Tsinghua Univ. (China)
Yuan Shi, Tsinghua Univ. (China)
Quan Yu, Tsinghua Univ. (China)
Xiang Qian, Tsinghua Univ. (China)
Xiaohao Wang, Tsinghua Univ. (China)

Published in SPIE Proceedings Vol. 10016:
High-Power Lasers and Applications VIII
Ruxin Li; Upendra N. Singh; Robert F. Walter, Editor(s)

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