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Proceedings Paper

Objective backscattering properties measurements at 2.52 terahertz
Author(s): Qi Li; Yi Zhou; Qian Li; Chang-Kun Fan; Yong-Peng Zhao; De-Ying Chen
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Paper Abstract

We present a system to measure objective backscattering properties at 2.52 terahertz (THz). The optical setup combining 90° off-axis parabolic mirrors with 15° off-axis parabolic mirror decreases the size of the system and then realizes its compact structure. The calibration object, a conducting sphere with a diameter of 50 mm, was introduced to eliminate the influence of the instability of THz radiation and the background noise on measurement results. The lock-in amplifier was adopted to enhance the signal-to-noise ratio (SNR) and then make it possible to observe delicate backscattering behaviors on the surface of the object. Backscattering properties of four scale models were measured in this paper. Experimental results indicate that the maximal error of our system is less than 1 dB, paving the way for practical measurements of objective backscattering properties at THz frequencies.

Paper Details

Date Published: 19 October 2016
PDF: 7 pages
Proc. SPIE 10153, Advanced Laser Manufacturing Technology, 101530O (19 October 2016); doi: 10.1117/12.2246609
Show Author Affiliations
Qi Li, Harbin Institute of Technology (China)
Yi Zhou, Harbin Institute of Technology (China)
Qian Li, Harbin Institute of Technology (China)
Chang-Kun Fan, Harbin Institute of Technology (China)
Yong-Peng Zhao, Harbin Institute of Technology (China)
De-Ying Chen, Harbin Institute of Technology (China)

Published in SPIE Proceedings Vol. 10153:
Advanced Laser Manufacturing Technology
Bingheng Lu; Huaming Wang, Editor(s)

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