
Proceedings Paper
Laser-induced damage on fused silica with photo-acoustic methodFormat | Member Price | Non-Member Price |
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Paper Abstract
The surface damage processes of fused silica are studied by a new photo-acoustic probe with Anti-Emi (Electron-Magnetic Interference), easy-adjusted and non-damage for the samples, and the damage thresholds is detected according to the rapid increase of the acoustic signals. Experimental results show that the damage threshold of fused silica samples is 13.86 J/cm2 at the wavelength of 1064 nm and the pulse width of 10 ns. This work may provide an effective technical support for the laser-induced damage detection.
Paper Details
Date Published: 9 November 2016
PDF: 6 pages
Proc. SPIE 10016, High-Power Lasers and Applications VIII, 100161Y (9 November 2016); doi: 10.1117/12.2246403
Published in SPIE Proceedings Vol. 10016:
High-Power Lasers and Applications VIII
Ruxin Li; Upendra N. Singh; Robert F. Walter, Editor(s)
PDF: 6 pages
Proc. SPIE 10016, High-Power Lasers and Applications VIII, 100161Y (9 November 2016); doi: 10.1117/12.2246403
Show Author Affiliations
Muyu Yi, Soochow Univ. (China)
Kai Ke, Soochow Univ. (China)
Jianjun Zhao, Huazhong Univ. of Science and Technology (China)
Kai Ke, Soochow Univ. (China)
Jianjun Zhao, Huazhong Univ. of Science and Technology (China)
Xiao Yuan, Soochow Univ. (China)
Key Lab. of Advanced Optical Manufacturing Technologies (China)
Key Lab. of Modern Optical Technologies (China)
Xiang Zhang, Soochow Univ. (China)
Key Lab. of Advanced Optical Manufacturing Technologies (China)
Key Lab. of Modern Optical Technologies (China)
Key Lab. of Advanced Optical Manufacturing Technologies (China)
Key Lab. of Modern Optical Technologies (China)
Xiang Zhang, Soochow Univ. (China)
Key Lab. of Advanced Optical Manufacturing Technologies (China)
Key Lab. of Modern Optical Technologies (China)
Published in SPIE Proceedings Vol. 10016:
High-Power Lasers and Applications VIII
Ruxin Li; Upendra N. Singh; Robert F. Walter, Editor(s)
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