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Proceedings Paper

Manufacture, alignment and measurement for a reflective triplet optics in imaging spectrometer
Author(s): Liyin Yuan; Zhiping He; Yueming Wang; Gang Lv
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Paper Abstract

Reflective triplet (RT) optics is an optical form with decenters and tilts of all the three mirrors. It can be used in spectrometer as collimator and reimager to get fine optical and spectral performances. To alleviate thermal and assembly stress deformation, opto-mechanical integrated design suggests that as with all the machine elements and the mainframe, the mirrors substrates are aluminum. All the mirrors are manufactured by single-point diamond turning technology and measured by interferometer or profilometer. Because of retro-reflection by grating or prism and reimaging away from the object field, solo three mirrors optical path of RT has some aberrations. So its alignment and measurement needs an aberration corrected measuring optical system with auxiliary plane and sphere mirrors and in which the RT optics used in four pass. Manufacture, alignment and measurement for a RT optics used in long wave infrared grating spectrometer is discussed here.

We realized the manufacture, alignment and test for the RT optics of a longwave infrared spectromter by CMM and interferometer. Wavefront error test by interferometer and surface profiles measured by profilometer indicate that performances of the manufactured mirrors exceed the requirements. Interferogram of the assembled RT optics shows that wavefront error rms is less than 0.0493λ@10.6μm vs design result 0.0207λ.

Paper Details

Date Published: 27 September 2016
PDF: 8 pages
Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96840B (27 September 2016); doi: 10.1117/12.2246278
Show Author Affiliations
Liyin Yuan, Shanghai Institute of Technical Physics (China)
Key Lab. of Space Active Opto-Electronics Technology (China)
Zhiping He, Shanghai Institute of Technical Physics (China)
Key Lab. of Space Active Opto-Electronics Technology (China)
Yueming Wang, Shanghai Institute of Technical Physics (China)
Key Lab. of Space Active Opto-Electronics Technology (China)
Gang Lv, Shanghai Institute of Technical Physics (China)
Key Lab. of Space Active Opto-Electronics Technology (China)


Published in SPIE Proceedings Vol. 9684:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Yudong Zhang; Fan Wu; Ming Xu; Sandy To, Editor(s)

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