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Proceedings Paper

Optimizing the loss of one-dimensional photonic crystal towards high-sensitivity Bloch-surface-wave sensors under intensity interrogation scheme
Author(s): Weijing Kong; Yuhang Wan; Kun Du; Wenhui Zhao; Shuang Wang; Zheng Zheng
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Paper Abstract

The reflected intensity change of the Bloch-surface-wave (BSW) resonance influenced by the loss of a truncated onedimensional photonic crystal structure is numerically analyzed and studied in order to enhance the sensitivity of the Bloch-surface-wave-based sensors. The finite truncated one-dimensional photonic crystal structure is designed to be able to excite BSW mode for water (n=1.33) as the external medium and for p-polarized plane wave incident light. The intensity interrogation scheme which can be operated on a typical Kretschmann prism-coupling configuration by measuring the reflected intensity change of the resonance dip is investigated to optimize the sensitivity. A figure of merit (FOM) is introduced to measure the performance of the one-dimensional photonic crystal multilayer structure under the scheme. The detection sensitivities are calculated under different device parameters with a refractive index change corresponding to different solutions of glycerol in de-ionized (DI)-water. The results show that the intensity sensitivity curve varies similarly with the FOM curve and the sensitivity of the Bloch-surface-wave sensor is greatly affected by the device loss, where an optimized loss value can be got. For the low-loss BSW devices, the intensity interrogation sensing sensitivity may drop sharply from the optimal value. On the other hand, the performance of the detection scheme is less affected by the higher device loss. This observation is in accordance with BSW experimental sensing demonstrations as well. The results obtained could be useful for improving the performance of the Bloch-surface-wave sensors for the investigated sensing scheme.

Paper Details

Date Published: 14 November 2016
PDF: 6 pages
Proc. SPIE 10025, Advanced Sensor Systems and Applications VII, 100250W (14 November 2016); doi: 10.1117/12.2246182
Show Author Affiliations
Weijing Kong, Tianjin Univ. of Technology and Education (China)
Yuhang Wan, BeiHang Univ. (China)
Kun Du, BeiHang Univ. (China)
Wenhui Zhao, Tianjin Univ. of Technology and Education (China)
Shuang Wang, Tianjin Univ. of Technology and Education (China)
Zheng Zheng, BeiHang Univ. (China)

Published in SPIE Proceedings Vol. 10025:
Advanced Sensor Systems and Applications VII
Tiegen Liu; Shibin Jiang; Rene Landgraf, Editor(s)

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