Share Email Print

Proceedings Paper

Full-field 3D shape measurement of specular surfaces by direct phase to depth relationship
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

This paper presents a new Phase Measuring Deflectometry (PMD) method to measure specular object having discontinuous surfaces. A mathematical model is established to directly relate absolute phase and depth, instead of phase and gradient. Based on the model, a hardware measuring system has been set up, which consists of a beam splitter to change the optical path, and two LCD screens to display the same sinusoidal fringe patterns. By using model-based and machine vision method, system calibration is accomplished to provide the required parameters and conditions. The verification tests are given to evaluate the effectiveness of the developed system. The 3D shape of an artificial step having multiple specular surfaces and a concave mirror has been measured. Initial experimental results show that the proposed measurement method can obtain 3D shape of specular objects with discontinuous surface effectively.

Paper Details

Date Published: 24 November 2016
PDF: 11 pages
Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 100230X (24 November 2016); doi: 10.1117/12.2246144
Show Author Affiliations
Zonghua Zhang, Hebei Univ. of Technology (China)
Univ. of Huddersfield (United Kingdom)
Yue Liu, Hebei Univ. of Technology (China)
Shujun Huang, Hebei Univ. of Technology (China)
Zhenqi Niu, Hebei Univ. of Technology (China)
Jiao Guo, Hebei Univ. of Technology (China)
Nan Gao, Hebei Univ. of Technology (China)
Feng Gao, Univ. of Huddersfield (United Kingdom)
Xiangqian Jiang, Univ. of Huddersfield (United Kingdom)

Published in SPIE Proceedings Vol. 10023:
Optical Metrology and Inspection for Industrial Applications IV
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?