Proceedings Paper
Design of non-contact measuring equipment for lunar sample sealing device| Format | Member Price | Non-Member Price |
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Paper Abstract
According to the thermal control coatings and the requirement of lunar sample sealing device parameters measuring The
Non-contact measuring equipment is designed and calibrated. Some relevant experimentation is carried out and
experiment result shows that the error of optical measuring system is consist with the contact measuring system in the
Non-contact measuring equipment and the Non-contact measuring equipment can be used to measure characteristic
parameters of lunar sample sealing device.
Paper Details
Date Published: 4 November 2016
PDF: 6 pages
Proc. SPIE 10026, Real-time Photonic Measurements, Data Management, and Processing II, 1002616 (4 November 2016); doi: 10.1117/12.2246137
Published in SPIE Proceedings Vol. 10026:
Real-time Photonic Measurements, Data Management, and Processing II
Ming Li; Bahram Jalali; Keisuke Goda; Kevin K. Tsia, Editor(s)
PDF: 6 pages
Proc. SPIE 10026, Real-time Photonic Measurements, Data Management, and Processing II, 1002616 (4 November 2016); doi: 10.1117/12.2246137
Show Author Affiliations
Cong Ma, Lanzhou Institute of Physics (China)
Ming Ji, Lanzhou Institute of Physics (China)
Ming Ji, Lanzhou Institute of Physics (China)
Published in SPIE Proceedings Vol. 10026:
Real-time Photonic Measurements, Data Management, and Processing II
Ming Li; Bahram Jalali; Keisuke Goda; Kevin K. Tsia, Editor(s)
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