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Proceedings Paper

Design of non-contact measuring equipment for lunar sample sealing device
Author(s): Chunyong Wang; Haoling Li; Cong Ma; Ming Ji
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Paper Abstract

According to the thermal control coatings and the requirement of lunar sample sealing device parameters measuring The Non-contact measuring equipment is designed and calibrated. Some relevant experimentation is carried out and experiment result shows that the error of optical measuring system is consist with the contact measuring system in the Non-contact measuring equipment and the Non-contact measuring equipment can be used to measure characteristic parameters of lunar sample sealing device.

Paper Details

Date Published: 4 November 2016
PDF: 6 pages
Proc. SPIE 10026, Real-time Photonic Measurements, Data Management, and Processing II, 1002616 (4 November 2016); doi: 10.1117/12.2246137
Show Author Affiliations
Chunyong Wang, Lanzhou Institute of Physics (China)
Haoling Li, Lanzhou Institute of Physics (China)
Cong Ma, Lanzhou Institute of Physics (China)
Ming Ji, Lanzhou Institute of Physics (China)

Published in SPIE Proceedings Vol. 10026:
Real-time Photonic Measurements, Data Management, and Processing II
Ming Li; Bahram Jalali; Keisuke Goda; Kevin K. Tsia, Editor(s)

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