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Proceedings Paper

Measurement of high-temperature spectral emissivity using integral blackbody approach
Author(s): Yijie Pan; Wei Dong; Hong Lin; Zundong Yuan; Pieter Bloembergen
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Paper Abstract

Spectral emissivity is one of the most critical thermophysical properties of a material for heat design and analysis. Especially in the traditional radiation thermometry, normal spectral emissivity is very important. We developed a prototype instrument based upon an integral blackbody method to measure material’s spectral emissivity at elevated temperatures. An optimized commercial variable-high-temperature blackbody, a high speed linear actuator, a linear pyrometer, and an in-house designed synchronization circuit was used to implemented the system. A sample was placed in a crucible at the bottom of the blackbody furnace, by which the sample and the tube formed a simulated reference blackbody which had an effective total emissivity greater than 0.985. During the measurement, a pneumatic cylinder pushed a graphite rode and then the sample crucible to the cold opening within hundreds of microseconds. The linear pyrometer was used to monitor the brightness temperature of the sample surface, and the corresponding opto-converted voltage was fed and recorded by a digital multimeter. To evaluate the temperature drop of the sample along the pushing process, a physical model was proposed. The tube was discretized into several isothermal cylindrical rings, and the temperature of each ring was measurement. View factors between sample and rings were utilized. Then, the actual surface temperature of the sample at the end opening was obtained. Taking advantages of the above measured voltage signal and the calculated actual temperature, normal spectral emissivity under the that temperature point was obtained. Graphite sample at 1300°C was measured to prove the validity of the method.

Paper Details

Date Published: 3 November 2016
PDF: 7 pages
Proc. SPIE 10030, Infrared, Millimeter-Wave, and Terahertz Technologies IV, 100300Z (3 November 2016); doi: 10.1117/12.2246016
Show Author Affiliations
Yijie Pan, National Institute of Metrology (China)
Wei Dong, National Institute of Metrology (China)
Hong Lin, National Institute of Metrology (China)
Zundong Yuan, National Institute of Metrology (China)
Pieter Bloembergen, National Institute of Metrology (China)

Published in SPIE Proceedings Vol. 10030:
Infrared, Millimeter-Wave, and Terahertz Technologies IV
Cunlin Zhang; Xi-Cheng Zhang; Masahiko Tani, Editor(s)

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