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Proceedings Paper

Spectral radiance characteristic measure method based on passive imaging FTIR spectrometer
Author(s): Song Yue; Guowei Jia; Juan Liang; Zhijie Zhang; Huawang Chen; Bo Wang; Bo Lei; Chensheng Wang
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Paper Abstract

The spectral characteristics of infrared radiation from target provide significant characteristics information for target's detection and track including radiance brightness, radiance intensity and spectrum characteristics of target. And the same time, the spectral characteristics provide the basis of target detection and recognize equipment's waveband optimization design and detection capability analysis. This paper using the passive imaging Fourier transformation infrared spectrometer measure the infrared spectral characteristic of target. The spectral range cover the medium wave and long wave infrared. And the instrument can interference imaging in 320×256 spatial resolution or other window size. This paper designs a set of calibration and test processes to realize the infrared spectral radiance measurement of target. Using this method, this paper test some typical infrared target. After the radiance calibration, the calibrated result is verified by standard radiance source. Thereby, the remote measurement of infrared background is taken as the comparison test. Finally, the typical infrared target spectral features are extracted and measured. The test results show that the method mentioned in this paper is practical.

Paper Details

Date Published: 3 November 2016
PDF: 9 pages
Proc. SPIE 10030, Infrared, Millimeter-Wave, and Terahertz Technologies IV, 100301Y (3 November 2016); doi: 10.1117/12.2245924
Show Author Affiliations
Song Yue, Huazhong Institute of Electro-Optics (China)
Guowei Jia, Huazhong Institute of Electro-Optics (China)
Juan Liang, Huazhong Institute of Electro-Optics (China)
Zhijie Zhang, Huazhong Institute of Electro-Optics (China)
Huawang Chen, Huazhong Institute of Electro-Optics (China)
Bo Wang, Huazhong Institute of Electro-Optics (China)
Bo Lei, Huazhong Institute of Electro-Optics (China)
Chensheng Wang, Huazhong Institute of Electro-Optics (China)

Published in SPIE Proceedings Vol. 10030:
Infrared, Millimeter-Wave, and Terahertz Technologies IV
Cunlin Zhang; Xi-Cheng Zhang; Masahiko Tani, Editor(s)

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