Share Email Print

Proceedings Paper

Infrared measurements of CVD diamond films
Author(s): Xiao-Hong Wang; Lawrence J. Pilione; Wei Zhu; Walter A. Yarbrough; W. R. Drawl; Russell F. Messier
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The growth surfaces of CVD diamond films are usually rough with polycrystalline crystallographic habits which presents a severe problem if CVD diamond films are to be used in infrared optics. Several methods are described in this paper in an effort to solve this problem. A polishing process was used to reduce the surface roughness by polishing the rough growth surface with a heated cast iron scaife. For polished films, near 70% transmittance was obtained over the whole range of 600-4000 cm-1, while the transmittance for non-polished films were much lower and varied strongly with the wavenumber. Absorptions believed due to carbon-hydrogen stretching bands and a silicon carbide phase were observed in the transmission spectra of polished diamond films.

Paper Details

Date Published: 1 December 1990
PDF: 8 pages
Proc. SPIE 1325, Diamond Optics III, (1 December 1990); doi: 10.1117/12.22455
Show Author Affiliations
Xiao-Hong Wang, The Pennsylvania State Univ. (United States)
Lawrence J. Pilione, The Pennsylvania State Univ. (United States)
Wei Zhu, The Pennsylvania State Univ. (United States)
Walter A. Yarbrough, The Pennsylvania State Univ. (United States)
W. R. Drawl, The Pennsylvania State Univ. (United States)
Russell F. Messier, The Pennsylvania State Univ. (United States)

Published in SPIE Proceedings Vol. 1325:
Diamond Optics III
Albert Feldman; Sandor Holly, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?