
Proceedings Paper
New generation VNIR/SWIR/TIR airborne imaging spectrometerFormat | Member Price | Non-Member Price |
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Paper Abstract
Imaging spectrometer plays an important role in the remote sensing application. Imaging spectrometer can collects and provides a unique spectral signature of many materials. The spectral signature may be absorbing, reflecting, and emitting. Generally, optical spectral bands for earth observing consist of VNIR, SWIR, TIR/LWIR. VNIR band imaging spectrometer is well-known in vegetation remote sensing and ocean detection. SWIR band imaging spectrometer is widely applied in mineralogy investigation. For its uniquely capability of spectral radiance measurement, TIR/LWIR imaging spectrometer attracts much attention these years. This paper will present a new generation VNIR/SWIR/TIR imaging spectrometer. The preliminary result of its first flight will also be shared. The spectral sampling intervals of VNIR/SWIR/TIR are 2.4nm/3nm/30nm, respectively. The spatial pixel numbers are 2800/1400/700,respectively. It’s a push-broom imaging spectrometer.
Paper Details
Date Published: 25 October 2016
PDF: 8 pages
Proc. SPIE 10156, Hyperspectral Remote Sensing Applications and Environmental Monitoring and Safety Testing Technology, 101560Q (25 October 2016); doi: 10.1117/12.2245541
Published in SPIE Proceedings Vol. 10156:
Hyperspectral Remote Sensing Applications and Environmental Monitoring and Safety Testing Technology
PDF: 8 pages
Proc. SPIE 10156, Hyperspectral Remote Sensing Applications and Environmental Monitoring and Safety Testing Technology, 101560Q (25 October 2016); doi: 10.1117/12.2245541
Show Author Affiliations
Yueming Wang, Shanghai Institute of Technical Physics (China)
Liqin Wei, Shanghai Institute of Technical Physics (China)
Univ. of Chinese Academy of Sciences (China)
Liyin Yuan, Shanghai Institute of Technical Physics (China)
Chunlai Li, Shanghai Institute of Technical Physics (China)
Gang Lv, Shanghai Institute of Technical Physics (China)
Liqin Wei, Shanghai Institute of Technical Physics (China)
Univ. of Chinese Academy of Sciences (China)
Liyin Yuan, Shanghai Institute of Technical Physics (China)
Chunlai Li, Shanghai Institute of Technical Physics (China)
Gang Lv, Shanghai Institute of Technical Physics (China)
Feng Xie, Shanghai Institute of Technical Physics (China)
Guicheng Han, Shanghai Institute of Technical Physics (China)
Rong Shu, Shanghai Institute of Technical Physics (China)
Jianyu Wang, Shanghai Institute of Technical Physics (China)
Guicheng Han, Shanghai Institute of Technical Physics (China)
Rong Shu, Shanghai Institute of Technical Physics (China)
Jianyu Wang, Shanghai Institute of Technical Physics (China)
Published in SPIE Proceedings Vol. 10156:
Hyperspectral Remote Sensing Applications and Environmental Monitoring and Safety Testing Technology
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