Share Email Print

Proceedings Paper

An effective rectification method for lenselet-based plenoptic cameras
Author(s): Jing Jin; Yiwei Cao; Weijia Cai; Wanlu Zheng; Ping Zhou
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The Lenselet-Based Plenoptic has recently drawn a lot of attention in the field of computational photography. The additional information inherent in light field allows a wide range of applications, but some preliminary processing of the raw image is necessary before further operations. In this paper, an effective method is presented for the rotation rectification of the raw image. The rotation is caused by imperfectly position of micro-lens array relative to the sensor plane in commercially available Lytro plenoptic cameras. The key to our method is locating the center of each microlens image, which is projected by a micro-lens. Because of vignetting, the pixel values at centers of the micro-lens image are higher than those at the peripheries. A mask is applied to probe the micro-lens image to locate the center area by finding the local maximum response. The error of the center coordinate estimate is corrected and the angle of rotation is computed via a subsequent line fitting. The algorithm is performed on two images captured by different Lytro cameras. The angles of rotation are -0.3600° and -0.0621° respectively and the rectified raw image is useful and reliable for further operations, such as extraction of the sub-aperture images. The experimental results demonstrate that our method is efficient and accurate.

Paper Details

Date Published: 31 October 2016
PDF: 6 pages
Proc. SPIE 10020, Optoelectronic Imaging and Multimedia Technology IV, 100200F (31 October 2016); doi: 10.1117/12.2245540
Show Author Affiliations
Jing Jin, Southeast Univ. (China)
Yiwei Cao, Southeast Univ. (China)
Weijia Cai, Southeast Univ. (China)
Wanlu Zheng, Southeast Univ. (China)
Ping Zhou, Southeast Univ. (China)

Published in SPIE Proceedings Vol. 10020:
Optoelectronic Imaging and Multimedia Technology IV
Qionghai Dai; Tsutomu Shimura, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?