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Proceedings Paper

Reconstructing spectral reflectance from digital camera through samples selection
Author(s): Bin Cao; Ningfang Liao; Wenming Yang; Haobo Chen
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Paper Abstract

Spectral reflectance provides the most fundamental information of objects and is recognized as the “fingerprint” of them, since reflectance is independent of illumination and viewing conditions. However, reconstructing high-dimensional spectral reflectance from relatively low-dimensional camera outputs is an illposed problem and most of methods requaired camera’s spectral responsivity. We propose a method to reconstruct spectral reflectance from digital camera outputs without prior knowledge of camera’s spectral responsivity. This method respectively averages reflectances of selected subset from main training samples by prescribing a limit to tolerable color difference between the training samples and the camera outputs. Different tolerable color differences of training samples were investigated with Munsell chips under D65 light source. Experimental results show that the proposed method outperforms classic PI method in terms of multiple evaluation criteria between the actual and the reconstructed reflectances. Besides, the reconstructed spectral reflectances are between 0-1, which make them have actual physical meanings and better than traditional methods.

Paper Details

Date Published: 31 October 2016
PDF: 7 pages
Proc. SPIE 10020, Optoelectronic Imaging and Multimedia Technology IV, 100200D (31 October 2016); doi: 10.1117/12.2245278
Show Author Affiliations
Bin Cao, Beijing Institute of Technology (China)
Ningfang Liao, Beijing Institute of Technology (China)
Wenming Yang, Beijing Institute of Technology (China)
Haobo Chen, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 10020:
Optoelectronic Imaging and Multimedia Technology IV
Qionghai Dai; Tsutomu Shimura, Editor(s)

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