
Proceedings Paper
Design and realization of photoelectric instrument binocular optical axis parallelism calibration systemFormat | Member Price | Non-Member Price |
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Paper Abstract
The maladjustment of photoelectric instrument binocular optical axis parallelism will affect the observe effect directly. A binocular optical axis parallelism digital calibration system is designed. On the basis of the principle of optical axis binocular photoelectric instrument calibration, the scheme of system is designed, and the binocular optical axis parallelism digital calibration system is realized, which include four modules: multiband parallel light tube, optical axis translation, image acquisition system and software system. According to the different characteristics of thermal infrared imager and low-light-level night viewer, different algorithms is used to localize the center of the cross reticle. And the binocular optical axis parallelism calibration is realized for calibrating low-light-level night viewer and thermal infrared imager.
Paper Details
Date Published: 19 October 2016
PDF: 7 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101550X (19 October 2016); doi: 10.1117/12.2245097
Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)
PDF: 7 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101550X (19 October 2016); doi: 10.1117/12.2245097
Show Author Affiliations
Jia-ju Ying, Shijiazhuang Mechanical Engineering College (China)
Yu-dan Chen, Shijiazhuang Mechanical Engineering College (China)
Jie Liu, Shijiazhuang Mechanical Engineering College (China)
Yu-dan Chen, Shijiazhuang Mechanical Engineering College (China)
Jie Liu, Shijiazhuang Mechanical Engineering College (China)
Dong-sheng Wu, Shijiazhuang Mechanical Engineering College (China)
Jun Lu, Shijiazhuang Mechanical Engineering College (China)
Jun Lu, Shijiazhuang Mechanical Engineering College (China)
Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)
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