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Proceedings Paper

Research on method and device of non-disperse atomic fluorescence excitation light source impurity detection
Author(s): Yaqing Jia; Hong Wu; Zhengsheng Shen
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Paper Abstract

Analysis on the impurities of non-dispersive atomic fluorescence exciting light source is given. A method is proposed to detect this kind of light source impurity by using spectral analysis, and a set of light source detection standard device was accomplished. Corresponding algorithm and application software were developed. The detection wavelength range of the device is 190~350 nm, the maximum allowable error is ±0.3 nm. The device achieved fast detection of the excitation light source impurity and could be verified by the experimental results.

Paper Details

Date Published: 19 October 2016
PDF: 10 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101550W (19 October 2016);
Show Author Affiliations
Yaqing Jia, Beijing Institute of Metrology (China)
Hong Wu, Beijing Institute of Metrology (China)
Zhengsheng Shen, Beijing Institute of Metrology (China)

Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)

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