Share Email Print

Proceedings Paper

Concentricity calibration of photogrammetry retro-reflector target
Author(s): Hengzheng Wei; Weinong Wang; Limei Pei; Guoying Ren
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Close range digital photogrammetry is being widely used in industrial measurements. The measurements are usually carried out with a mobile retro-reflector target, which is consists of a shaft and reflective target fixed in the center of the shaft. When the center of the target and the axis of the shaft is not consistent, it will introduce measurement error. Therefore, the concentricity of target is an important parameter for the measurement results. To achieve the concentricity of retro-reflector target a multi-sensor coordinate measurement machine with imaging probe and touch probe is used. In this combined measurement system the touch probe measure the axis of the shaft, and imaging probe measure the center of reflective target. An artifact is designed to evaluate the performance of combined system. This artifact is defined as a sharp edged hole in a metal plate. It is suitable to measure with touch probe as well as imaging probe. The touch probe measures 25 points on the hole and then with the imaging probe. With all the points measured by two kinds of probe the evaluation parameters including combination size error, form error and location error are calculated. These parameters are consistent with the ISO standard 10360-9. It indicates that combined measurement uncertainty is 3.2 microns which can meet the calibration requirements of target concentricity.

Paper Details

Date Published: 24 November 2016
PDF: 6 pages
Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 1002309 (24 November 2016); doi: 10.1117/12.2244876
Show Author Affiliations
Hengzheng Wei, National Institute of Metrology (China)
Weinong Wang, National Institute of Metrology (China)
Limei Pei, National Institute of Metrology (China)
Guoying Ren, National Institute of Metrology (China)

Published in SPIE Proceedings Vol. 10023:
Optical Metrology and Inspection for Industrial Applications IV
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?