
Proceedings Paper
An endoscope designed with 3D measurement functionsFormat | Member Price | Non-Member Price |
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Paper Abstract
The endoscopic system is widely used in medical and industrial areas, but how to realize the high-precision three-dimensional measurement in the limited space scale still faces many challenges. A method based on the four-step phase-shifting structured light illumination is proposed in this paper for endoscopic 3D measurements. Structured light of which the adjacent phase shift is 90 degrees is generated by the different parts of the time-sharing lighting stripe grating of the optical fiber bundle; CMOS camera is used to collect four structured light images with the phase shift. Finally, the method of four-step phase-shifting is used to demodulate 3D information from the images, and a relative measurement accuracy of 95% within the range of 15-200mm can be obtained. The endoscope with a field of view of 90 degrees, a image resolution of 1280 * 800 and 3D depth calculation time of 0.2 seconds has advantages of simple structure, large field of view, high accuracy and good real-time measurement.
Paper Details
Date Published: 19 October 2016
PDF: 6 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101550N (19 October 2016); doi: 10.1117/12.2244834
Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)
PDF: 6 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101550N (19 October 2016); doi: 10.1117/12.2244834
Show Author Affiliations
Qi-hai Zhu, Beijing Institute of Technology (China)
Northwest Institute of Nuclear Technology (China)
Zheng-lin Li, Zhejiang Univ. (China)
Li-qiang Wang, Zhejiang Univ. (China)
Northwest Institute of Nuclear Technology (China)
Zheng-lin Li, Zhejiang Univ. (China)
Li-qiang Wang, Zhejiang Univ. (China)
Chang-Ming Zhao, Beijing Institute of Technology (China)
Peng Xu, Beijing Institute of Technology (China)
Peng Xu, Beijing Institute of Technology (China)
Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)
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