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Proceedings Paper

Dynamic X-ray phase imaging based on an aperture array
Author(s): Gongxiang Wei; Yunyan Liu; Tiqiao Xiao
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Paper Abstract

A noniterative method for dynamic X-ray phase imaging from the recorded far-field diffraction intensity distribution of the object wavefront, sampled by a sampling plate, is proposed. The sampling plate consists of a two-dimensional (2D) aperture array and a central reference aperture. In this method, the complex amplitude of the object wavefront, especially the phase that carries the inner refraction information, can be retrieved from the inverse Fourier transform of the diffraction intensity distribution by directly filtering with a same aperture array. As this method requires only a single measurement of the diffraction intensity pattern and does not need any iterative algorithm, in principle, it provides a practical approach for dynamic phase imaging in a wide range of wavelengths. The experimental results demonstrated that the proposed method is practicable. The proposed may have potential application in high-efficiency phase retrieval for coherent diffraction imaging and phase contrast imaging.

Paper Details

Date Published: 19 October 2016
PDF: 11 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101550J (19 October 2016); doi: 10.1117/12.2244289
Show Author Affiliations
Gongxiang Wei, Shandong Univ. of Technology (China)
Shanghai Institute of Applied Physics (China)
Yunyan Liu, Shandong Univ. of Technology (China)
Tiqiao Xiao, Shanghai Institute of Applied Physics (China)

Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)

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