
Proceedings Paper
Design of efficient and simple interface testing equipment for opto-electric tracking systemFormat | Member Price | Non-Member Price |
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Paper Abstract
Interface testing for opto-electric tracking system is one important work to assure system running performance, aiming to
verify the design result of every electronic interface matching the communication protocols or not, by different levels.
Opto-electric tracking system nowadays is more complicated, composed of many functional units. Usually, interface
testing is executed between units manufactured completely, highly depending on unit design and manufacture progress
as well as relative people. As a result, it always takes days or weeks, inefficiently. To solve the problem, this paper
promotes an efficient and simple interface testing equipment for opto-electric tracking system, consisting of optional
interface circuit card, processor and test program. The hardware cards provide matched hardware interface(s), easily
offered from hardware engineer. Automatic code generation technique is imported, providing adaption to new
communication protocols. Automatic acquiring items, automatic constructing code architecture and automatic encoding
are used to form a new program quickly with adaption. After simple steps, a standard customized new interface testing
equipment with matching test program and interface(s) is ready for a waiting-test system in minutes. The efficient and
simple interface testing equipment for opto-electric tracking system has worked for many opto-electric tracking system
to test entire or part interfaces, reducing test time from days to hours, greatly improving test efficiency, with high
software quality and stability, without manual coding. Used as a common tool, the efficient and simple interface testing
equipment for opto-electric tracking system promoted by this paper has changed traditional interface testing method and
created much higher efficiency.
Paper Details
Date Published: 24 October 2016
PDF: 6 pages
Proc. SPIE 9682, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 968212 (24 October 2016); doi: 10.1117/12.2243951
Published in SPIE Proceedings Vol. 9682:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes
Myung K. Cho; Bin Fan, Editor(s)
PDF: 6 pages
Proc. SPIE 9682, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 968212 (24 October 2016); doi: 10.1117/12.2243951
Show Author Affiliations
Qiong Liu, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)
Chao Deng, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)
Univ. of Chinese Academy of Sciences (China)
Key Lab. of Optical Engineering (China)
Chao Deng, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)
Univ. of Chinese Academy of Sciences (China)
Published in SPIE Proceedings Vol. 9682:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes
Myung K. Cho; Bin Fan, Editor(s)
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