Proceedings Paper
Particle detection of porous media using scanning electron microscope images| Format | Member Price | Non-Member Price |
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Paper Abstract
Porous media have a wide range of applications in the field of material science and geology. The achievement of the shape parameters of a porous medium gives great significance to the reconstruction of the medium and the calculation of physical parameters such as porosity and permeability. A kind of particular porous media are focused on in the paper which are composed of randomly packed spheres made of glass. A modified Hough transform method using scanning electron microscope (SEM) images is proposed to detect the particles that compose the medium. The raw gray level image is preprocessed using a Gaussian filter. Then a modified vote mechanism is applied to transform the edge points obtained by gradient map into the accumulation array of the center locations. After a non-maximum suppression, final circle centers are picked up and their radii are estimated. The method is conducted on several SEM images, indicating the method can achieve a remarkable accuracy of ~75%.
Paper Details
Date Published: 29 August 2016
PDF: 5 pages
Proc. SPIE 10033, Eighth International Conference on Digital Image Processing (ICDIP 2016), 100334R (29 August 2016);
Published in SPIE Proceedings Vol. 10033:
Eighth International Conference on Digital Image Processing (ICDIP 2016)
Charles M. Falco; Xudong Jiang, Editor(s)
PDF: 5 pages
Proc. SPIE 10033, Eighth International Conference on Digital Image Processing (ICDIP 2016), 100334R (29 August 2016);
Show Author Affiliations
Mengyin Fu, Nanjing Univ. of Science and Technology (China)
Meifeng Xiao, Beijing Institute of Technology (China)
Key Lab. of Complex System Intelligent Control and Decision (China)
Meiling Wang, Beijing Institute of Technology (China)
Key Lab. of Complex System Intelligent Control and Decision (China)
Meifeng Xiao, Beijing Institute of Technology (China)
Key Lab. of Complex System Intelligent Control and Decision (China)
Meiling Wang, Beijing Institute of Technology (China)
Key Lab. of Complex System Intelligent Control and Decision (China)
Siyuan Cheng, Beijing Institute of Technology (China)
Key Lab. of Complex System Intelligent Control and Decision (China)
Xiang Li, Beijing Institute of Technology (China)
Key Lab. of Complex System Intelligent Control and Decision (China)
Key Lab. of Complex System Intelligent Control and Decision (China)
Xiang Li, Beijing Institute of Technology (China)
Key Lab. of Complex System Intelligent Control and Decision (China)
Published in SPIE Proceedings Vol. 10033:
Eighth International Conference on Digital Image Processing (ICDIP 2016)
Charles M. Falco; Xudong Jiang, Editor(s)
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