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Proceedings Paper

Process for the Φ130 sapphire window element with long distance and high resolution
Author(s): Zengqi Xu; Ying Su; Jianli Lei; Rui Guo; Feng Zhang; Xinlong Guo; Xuanmin Liu; Taohui Sun
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Paper Abstract

With the process test for the choice of materials, the test materials and the molds, the abrasives, the temperature and the different machining process monitoring parameters of the polishing machine, the process method and the quality control technology were figured out for the Φ130 sapphire window element with long distance and high resolution (hereinafter referred to as window element), meantime, the optimum process condition was determined to machine the element. The results were that the high resolution imaging window was processed with the surface roughness Ra of 0.639nm, the transmission distortion of λ/10 (λ=632.8nm), the parallel error of 5″, the resolution of 1.47″ and the focal length of 5 km, which can satisfy the imaging requirements better for the military photoelectric device for sapphire window with long distance and high resolution.

Paper Details

Date Published: 28 October 2016
PDF: 8 pages
Proc. SPIE 9683, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 96831J (28 October 2016); doi: 10.1117/12.2243626
Show Author Affiliations
Zengqi Xu, Xi'an Institute of Applied Optics (China)
Ying Su, Xi'an Institute of Applied Optics (China)
Jianli Lei, Xi'an Institute of Applied Optics (China)
Rui Guo, Xi'an Institute of Applied Optics (China)
Feng Zhang, Xi'an Institute of Applied Optics (China)
Xinlong Guo, Xi'an Institute of Applied Optics (China)
Xuanmin Liu, Xi'an Institute of Applied Optics (China)
Taohui Sun, Xi'an Institute of Applied Optics (China)


Published in SPIE Proceedings Vol. 9683:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Wenhan Jiang; Li Yang; Oltmann Riemer; Shengyi Li; Yongjian Wan, Editor(s)

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