
Proceedings Paper
Study on precision processing of L-form ZnSe deflect prismFormat | Member Price | Non-Member Price |
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Paper Abstract
As the core component of optical system of Roll-Pitch seekers, the L-form ZnSe deflect prism is directly affecting the imaging quality of optical. For L-form defect prism’s complex polyhedron plane structure and the feature of CVD ZnSe polycrystalline material, this paper propose one processing of single point diamond fly-cutting, analyze the transformation calculation method of each plane’s coordinate. A kind of special clamp which ensure that all working surface of prism could be cut by once clamping is designed. Base on parameters of turning for CVD ZnSe , the deflect prisms are been processed, the measure result of angle error is below 12", the surface error (rms) reach 0.022λ, which satisfies the demand of manufacturing accuracy. It provide effective processing methods for optical parts with complex space.
Paper Details
Date Published: 28 October 2016
PDF: 6 pages
Proc. SPIE 9683, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 96831T (28 October 2016); doi: 10.1117/12.2243452
Published in SPIE Proceedings Vol. 9683:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Wenhan Jiang; Li Yang; Oltmann Riemer; Shengyi Li; Yongjian Wan, Editor(s)
PDF: 6 pages
Proc. SPIE 9683, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 96831T (28 October 2016); doi: 10.1117/12.2243452
Show Author Affiliations
Sizhe Ye, Tianjin Jinhang Institute of Technical Physics (China)
Changshun Hui, Tianjin Jinhang Institute of Technical Physics (China)
Changshun Hui, Tianjin Jinhang Institute of Technical Physics (China)
Hao Zhang, Tianjin Jinhang Institute of Technical Physics (China)
Yongbin Lu, Tianjin Univ. (China)
Yongbin Lu, Tianjin Univ. (China)
Published in SPIE Proceedings Vol. 9683:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Wenhan Jiang; Li Yang; Oltmann Riemer; Shengyi Li; Yongjian Wan, Editor(s)
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