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Proceedings Paper

Structure-related anisotropic index of the optical thin films
Author(s): Wei Zhang; Jian-Ying Fan; Y. Mu
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Paper Abstract

The cylindrical model of optical thin films microstructure is assumed for the derivation of the equations expressing the structure-dependent anisotropic optical parameters in this paper. The equations are given for various values of cylinder obliquity and for several incident plane orientations. The equations are based on a capacitive model in which two index components are given and on the dielectric ellipsoid theory. They are applied to modeling ZnS thin films and the computed results have been given. We discuss the results, especially noting consistency of our model-based computations with measurements.

Paper Details

Date Published: 1 December 1990
PDF: 9 pages
Proc. SPIE 1324, Modeling of Optical Thin Films II, (1 December 1990); doi: 10.1117/12.22428
Show Author Affiliations
Wei Zhang, Harbin Institute of Technology (China)
Jian-Ying Fan, Harbin Institute of Technology (China)
Y. Mu, Harbin Institute of Technology (China)

Published in SPIE Proceedings Vol. 1324:
Modeling of Optical Thin Films II
Michael Ray Jacobson, Editor(s)

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