In the use of image sensors such as CCD, CMOS and so on, the noise caused by thermal dark signal will influence the imaging results to a certain extent. Dark current noise exists in every photoelectric devices and it is directly related to the temperature. So it’s a principle way that cool the image sensors’ temperature to suppress the dark current noise. This article presents a kind of TEC cooling package integrated with four stages TEC, a heat sink and an insulating cavity, to meet the requirement of image sensors’ refrigeration. Theoretical analysis of this cooling package was done from the view of heat transfer. The modeling and thermal simulated analysis are performed by finite element simulation analysis software ANSYS Icepak, comparing the experimental results in the conditions of different ambient temperature, different heat load and vacuumizing or filling the cavity.

Date Published: 25 October 2016
PDF: 7 pages
Proc. SPIE 9686, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices, 968613 (25 October 2016); doi: 10.1117/12.2242713

Published in SPIE Proceedings Vol. 9686:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)