Proceedings Paper
Coherent synthetic imaging using multi-aperture scanning Fourier ptychography| Format | Member Price | Non-Member Price |
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Paper Abstract
The high resolution is what the synthetic aperture technique quests for. In this paper, we propose an approach of coherent synthetic imaging with sparse aperture systems using multi-aperture scanning Fourier ptychography algorithm, which can further improve the resolution of sparse aperture systems. The reported technique first acquires a series of raw images by scanning a sparse aperture system and then the captured images are used to synthesize a larger spectrum in the frequency domain using aperture-scanning Fourier ptychography algorithm. The system’s traveling circumvent its diffraction limit so that a super-resolution image can be obtained. Numerical simulation demonstrates the validity. The technique proposed in this paper may find wide applications in synthetic aperture imaging and astronomy.
Paper Details
Date Published: 21 October 2016
PDF: 6 pages
Proc. SPIE 9987, Electro-Optical and Infrared Systems: Technology and Applications XIII, 998716 (21 October 2016); doi: 10.1117/12.2241960
Published in SPIE Proceedings Vol. 9987:
Electro-Optical and Infrared Systems: Technology and Applications XIII
David A. Huckridge; Reinhard Ebert; Stephen T. Lee, Editor(s)
PDF: 6 pages
Proc. SPIE 9987, Electro-Optical and Infrared Systems: Technology and Applications XIII, 998716 (21 October 2016); doi: 10.1117/12.2241960
Show Author Affiliations
Zongliang Xie, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)
Univ. of Chinese Academy of Sciences (China)
Haotong Ma, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)
National Univ. of Defense Technology (China)
Key Lab. of Optical Engineering (China)
Univ. of Chinese Academy of Sciences (China)
Haotong Ma, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)
National Univ. of Defense Technology (China)
Bo Qi, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)
Ge Ren, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)
Key Lab. of Optical Engineering (China)
Ge Ren, Institute of Optics and Electronics (China)
Key Lab. of Optical Engineering (China)
Published in SPIE Proceedings Vol. 9987:
Electro-Optical and Infrared Systems: Technology and Applications XIII
David A. Huckridge; Reinhard Ebert; Stephen T. Lee, Editor(s)
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