The recent development of a high-brightness MeV-photon source based on inverse-Compton scattering (ICS) has opened up exciting new possibilities for high-resolution radiography of dense objects. The x-ray beam is extremely bright, micron-source size, with mrad divergence, and high-spectral density, which makes it ideal for studies where high-resolution is required. The x-ray source is tunable over a wide range of parameters and we will discuss how the adjustable source parameters affect both transverse and longitudinal resolution. We then present results on the radiography of a thick steel object using this ICS source, and demonstrate the capabilities of this source with respect to operation at high photon energy while providing high spatial resolution.

Date Published: 16 September 2016
PDF: 9 pages
Proc. SPIE 9964, Advances in Laboratory-based X-Ray Sources, Optics, and Applications V, 99640G (16 September 2016); doi: 10.1117/12.2241606

Published in SPIE Proceedings Vol. 9964:
Advances in Laboratory-based X-Ray Sources, Optics, and Applications V
Ali M. Khounsary; Gert E. van Dorssen, Editor(s)