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Proceedings Paper

Transient imaging for real-time tracking around a corner
Author(s): Jonathan Klein; Martin Laurenzis; Matthias Hullin
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Paper Abstract

Non-line-of-sight imaging is a fascinating emerging area of research and expected to have an impact in numerous application fields including civilian and military sensing. Performance of human perception and situational awareness can be extended by the sensing of shapes and movement around a corner in future scenarios.

Rather than seeing through obstacles directly, non-line-of-sight imaging relies on analyzing indirect reflections of light that traveled around the obstacle. In previous work, transient imaging was established as the key mechanic to enable the extraction of useful information from such reflections.

So far, a number of different approaches based on transient imaging have been proposed, with back projection being the most prominent one. Different hardware setups were used for the acquisition of the required data, however all of them have severe drawbacks such as limited image quality, long capture time or very high prices. In this paper we propose the analysis of synthetic transient renderings to gain more insights into the transient light transport. With this simulated data, we are no longer bound to the imperfect data of real systems and gain more flexibility and control over the analysis.

In a second part, we use the insights of our analysis to formulate a novel reconstruction algorithm. It uses an adapted light simulation to formulate an inverse problem which is solved in an analysis-by-synthesis fashion. Through rigorous optimization of the reconstruction, it then becomes possible to track known objects outside the line of side in real time. Due to the forward formulation of the light transport, the algorithm is easily expandable to more general scenarios or different hardware setups. We therefore expect it to become a viable alternative to the classic back projection approach in the future.

Paper Details

Date Published: 21 October 2016
PDF: 12 pages
Proc. SPIE 9988, Electro-Optical Remote Sensing X, 998802 (21 October 2016); doi: 10.1117/12.2241179
Show Author Affiliations
Jonathan Klein, French-German Research Institute Saint-Louis (France)
Univ. of Bonn (Germany)
Martin Laurenzis, French-German Research Institute Saint-Louis (France)
Matthias Hullin, Univ. of Bonn (Germany)

Published in SPIE Proceedings Vol. 9988:
Electro-Optical Remote Sensing X
Gary Kamerman; Ove Steinvall, Editor(s)

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