In the past three decades, the Shenzhen city, which is located in south of China, has experienced a rapid urbanization process characterized by sharp decrease in farmland and increases in urban area. This rapid urbanization is one of the main causes of many environmental and ecological problems including urban heat island (UHI). Therefore, the monitoring of rapid urbanization regions and the environment is of critical importance for their sustainable development. In this study, Landsat-8 OLI and TIR images, which were acquired on 2013, are used to monitor urban heat island. After radiometric calibration and atmospheric correction with a simplified method for the atmospheric correction (SMAC) are applied to OLI image, an index-based build-up index (IBI), which is based on the soil adjusted vegetation index (SAVI), the modified normalized difference water index (MNDWI) and the normalized difference built-up index (NDBI), is employed to extract the build-up land features with a given thresholds. A single-channel algorithm is used to retrieve land surface temperature while the land surface emissivity is derived from a normalized differential vegetation index (NDVI) thresholds method. Surface urban heat island index (SUHII) and urban heat island ratio index (URI) are computed for ten districts of Shenzhen based on build-up land distribution and land surface temperature data. A correlation analysis is conducted between heat island index (including SUHII and URI) and socio-economic statistics (including total population and population density) also are included in this analysis. The results show that, a weak relationship between urban heat island and socio-economic statistics are found.

Date Published: 17 May 2016
PDF: 7 pages
Proc. SPIE 9840, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XXII, 98402A (17 May 2016); doi: 10.1117/12.2240254

Published in SPIE Proceedings Vol. 9840:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XXII
Miguel Velez-Reyes; David W. Messinger, Editor(s)