
Proceedings Paper
Design of KB complex type microscope for ICF x-ray diagnosticsFormat | Member Price | Non-Member Price |
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Paper Abstract
In the field of target diagnostics for Initial Confinement Fusion experiment, high resolution X-ray imaging system is
seriously necessary to record the evolution details of target ablation-front disturbance at different energy points of backlight
conditions. Kirkpatrick-Baez mirror is a wide used imaging system to achieve a large efficient field of view with high
spatial resolution and energy transmitting capability. In this paper, we designed a novel type of reflective microscope based
on Kirkpatrick-Baez structure, and this system can achieve 5μm spatial resolution at 600μm field of view specific energy
point in one dimension.
Paper Details
Date Published: 15 September 2016
PDF: 6 pages
Proc. SPIE 9963, Advances in X-Ray/EUV Optics and Components XI, 99630X (15 September 2016); doi: 10.1117/12.2240104
Published in SPIE Proceedings Vol. 9963:
Advances in X-Ray/EUV Optics and Components XI
Ali M. Khounsary; Shunji Goto; Christian Morawe, Editor(s)
PDF: 6 pages
Proc. SPIE 9963, Advances in X-Ray/EUV Optics and Components XI, 99630X (15 September 2016); doi: 10.1117/12.2240104
Show Author Affiliations
Qing Xie, Tongji Univ. (China)
Baozhong Mu, Tongji Univ. (China)
Yaran Li, Tongji Univ. (China)
Qiushi Huang, Tongji Univ. (China)
Zhanshan Wang, Tongji Univ. (China)
Baozhong Mu, Tongji Univ. (China)
Yaran Li, Tongji Univ. (China)
Qiushi Huang, Tongji Univ. (China)
Zhanshan Wang, Tongji Univ. (China)
Zhurong Cao, China Academy of Engineering Physics (China)
Jianjun Dong, China Academy of Engineering Physics (China)
Shenye Liu, China Academy of Engineering Physics (China)
Yongkun Ding, China Academy of Engineering Physics (China)
Jianjun Dong, China Academy of Engineering Physics (China)
Shenye Liu, China Academy of Engineering Physics (China)
Yongkun Ding, China Academy of Engineering Physics (China)
Published in SPIE Proceedings Vol. 9963:
Advances in X-Ray/EUV Optics and Components XI
Ali M. Khounsary; Shunji Goto; Christian Morawe, Editor(s)
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