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Proceedings Paper

System for inspection of package seal integrity
Author(s): Terry G. Gibson
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Paper Abstract

There is an increasing acceptance of reduced waste packaging methods for pharmaceutical and medical products. The high level of product integrity must be maintained, while manufacturing lines are required to increase production rates. To ensure their confidence in these packaging methods, manufacturers have turned to process validation as one method of check. In addition to that effort, automated on-line inspection has become increasingly important. Automated inspection can be used to augment manual inspection techniques that are viable at slower production rates. In this paper we explore the elements of a systematic approach that can provide 100% automatic inspection of product seals at full production rates. The various materials used to seal packages effect the system configuration. One such package sealing material is highly specular (mirror-like) laminated foil. A characteristic of this packaging method is its ability to reflect nearly all of the light from the surface. However, the heat process required to bond the seal to the package creates a coining effect where a uniform, low to medium intensity light source, transmitted at a low incident angle, can be used to identify seal defects. It is equally difficult to inspect package seals that are opaque, translucent, or transparent. Each seal material requires a specific lighting solution. When using reflective material, great care must be taken to develop and integrate the lighting method to an automated package seal inspection system.

Paper Details

Date Published: 3 October 1995
PDF: 3 pages
Proc. SPIE 2597, Machine Vision Applications, Architectures, and Systems Integration IV, (3 October 1995); doi: 10.1117/12.223996
Show Author Affiliations
Terry G. Gibson, Perceptics Corp. (United States)

Published in SPIE Proceedings Vol. 2597:
Machine Vision Applications, Architectures, and Systems Integration IV
Bruce G. Batchelor; Susan Snell Solomon; Frederick M. Waltz, Editor(s)

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