Proceedings Paper
Polarization ratio property and material classification method in passive millimeter wave polarimetric imaging| Format | Member Price | Non-Member Price |
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Paper Abstract
Polarimetric measurements can provide additional information as compared to unpolarized ones. In this paper, linear polarization ratio (LPR) is created to be a feature discriminator. The LPR properties of several materials are investigated using Fresnel theory. The theoretical results show that LPR is sensitive to the material type (metal or dielectric). Then a linear polarization ratio-based (LPR-based) method is presented to distinguish between metal and dielectric materials. In order to apply this method to practical applications, the optimal range of incident angle have been discussed. The typical outdoor experiments including various objects such as aluminum plate, grass, concrete, soil and wood, have been conducted to validate the presented classification method.
Paper Details
Date Published: 21 October 2016
PDF: 6 pages
Proc. SPIE 9993, Millimetre Wave and Terahertz Sensors and Technology IX, 99930K (21 October 2016); doi: 10.1117/12.2239946
Published in SPIE Proceedings Vol. 9993:
Millimetre Wave and Terahertz Sensors and Technology IX
Neil A. Salmon; Sherif Sayed Ahmed, Editor(s)
PDF: 6 pages
Proc. SPIE 9993, Millimetre Wave and Terahertz Sensors and Technology IX, 99930K (21 October 2016); doi: 10.1117/12.2239946
Show Author Affiliations
Yayun Cheng, Huazhong Univ. of Science and Technology (China)
Bo Qi, Huazhong Univ. of Science and Technology (China)
Siyuan Liu, Huazhong Univ. of Science and Technology (China)
Bo Qi, Huazhong Univ. of Science and Technology (China)
Siyuan Liu, Huazhong Univ. of Science and Technology (China)
Fei Hu, Huazhong Univ. of Science and Technology (China)
National Key Lab. of Science and Technology on Multi-Spectral Information Processing (China)
Liangqi Gui, Huazhong Univ. of Science and Technology (China)
National Key Lab. of Science and Technology on Multi-Spectral Information Processing (China)
Xiaohui Peng, Huazhong Univ. of Science and Technology (China)
National Key Lab. of Science and Technology on Multi-Spectral Information Processing (China)
Liangqi Gui, Huazhong Univ. of Science and Technology (China)
National Key Lab. of Science and Technology on Multi-Spectral Information Processing (China)
Xiaohui Peng, Huazhong Univ. of Science and Technology (China)
Published in SPIE Proceedings Vol. 9993:
Millimetre Wave and Terahertz Sensors and Technology IX
Neil A. Salmon; Sherif Sayed Ahmed, Editor(s)
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