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Proceedings Paper

Application of SKIPSM to binary correlation
Author(s): Frederick M. Waltz
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Paper Abstract

Binary correlation is often used for finding specified patterns in complex binary images, especially in industrial inspection tasks such as locating the corners and/or edges of parts. As such, it is an important tool for higher-level 'intelligent' vision systems. Binary correlation is a form of binary template matching which provides a numerical value corresponding to 'degree of fit' rather than an 'all or nothing' answer. Commercially available high-speed image processing systems can readily perform this operation using linear convolvers, but such convolvers are very expensive except for very small kernels. Furthermore, linear convolvers constitute a gross 'overkill' for the relatively simple operation of binary correlation. Specialized binary convolvers have been built, but are not part of standard commercial systems. This paper describes a new pipelined implementation of binary correlation which fits into the standard SKIPSM (separated-kernel image processing using finite state machines) architecture and which can be built using standard ICs costing less than $500 total. The same approach can also be implemented in software, providing an order-of-magnitude increase in speed at no extra cost. Furthermore, this same SKIPSM architecture is highly versatile and programmable, allowing it to be software-reconfigured to perform hundreds of other pipelined image processing operations.

Paper Details

Date Published: 3 October 1995
PDF: 10 pages
Proc. SPIE 2597, Machine Vision Applications, Architectures, and Systems Integration IV, (3 October 1995); doi: 10.1117/12.223967
Show Author Affiliations
Frederick M. Waltz, Consultant (United States)

Published in SPIE Proceedings Vol. 2597:
Machine Vision Applications, Architectures, and Systems Integration IV
Bruce G. Batchelor; Susan Snell Solomon; Frederick M. Waltz, Editor(s)

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