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Proceedings Paper

The analysis of long-wave infrared polarization signal of typical material targets
Author(s): Yan Zhang; Zhi-guang Shi; Xiao-tian Chen; Shu-li Song
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Paper Abstract

Infrared polarization imaging is a new kind of infrared detection technology developed in recent ten years. Different from the traditional detection method of infrared imaging, infrared polarization imaging can not only obtain infrared radiation intensity information of targets, but also obtain the infrared radiation polarization information. So the polarization of the target scene is the physical basis of infrared polarization imaging detection. On the basis of the research about infrared polarization imaging theory, the characteristics of long-wave infrared polarization detection was analyzed in this paper. Firstly, the paper studied long-wave infrared polarization state and interaction effect which coming from the spontaneous emission of target and environment, then designed the analysis experiment about long-wave infrared polarization characteristics that coming from spontaneous radiation, further and verified the forming mechanism of long wave infrared polarization. Through the several experiments that the long wave polarization information of different material objects being measured, a physical phenomenon was found that with the long-wave thermal radiation transmitting form high temperature object to low temperature object, the polarization characteristics transfer process had been happened at the same time, and the degree of this transfer was associated with the material and self-temperature of the objects.

Paper Details

Date Published: 14 September 2016
PDF: 14 pages
Proc. SPIE 9970, Optics and Photonics for Information Processing X, 99701S (14 September 2016); doi: 10.1117/12.2239318
Show Author Affiliations
Yan Zhang, National Univ. of Defense Technology (China)
Zhi-guang Shi, National Univ. of Defense Technology (China)
Xiao-tian Chen, National Univ. of Defense Technology (China)
Shu-li Song, National Univ. of Defense Technology (China)

Published in SPIE Proceedings Vol. 9970:
Optics and Photonics for Information Processing X
Khan M. Iftekharuddin; Abdul A. S. Awwal; Mireya García Vázquez; Andrés Márquez; Mohammad A. Matin, Editor(s)

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