Proceedings Paper
Critical science instrument alignment of the James Webb Space Telescope (JWST) Integrated Science Instrument Module (ISIM)| Format | Member Price | Non-Member Price |
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Paper Abstract
This paper describes the critical instrument alignment terms associated with the six-degree of freedom alignment of each the Science Instrument (SI) in the James Webb Space Telescope (JWST), including focus, pupil shear, pupil clocking, and boresight. We present the test methods used during cryogenic-vacuum tests to directly measure the performance of each parameter, the requirements levied on each, and the impact of any violations of these requirements at the instrument and Observatory level.
Paper Details
Date Published: 27 September 2016
PDF: 18 pages
Proc. SPIE 9951, Optical System Alignment, Tolerancing, and Verification X, 995106 (27 September 2016); doi: 10.1117/12.2238825
Published in SPIE Proceedings Vol. 9951:
Optical System Alignment, Tolerancing, and Verification X
José Sasián; Richard N. Youngworth, Editor(s)
PDF: 18 pages
Proc. SPIE 9951, Optical System Alignment, Tolerancing, and Verification X, 995106 (27 September 2016); doi: 10.1117/12.2238825
Show Author Affiliations
Scott O. Rohrbach, NASA Goddard Space Flight Ctr. (United States)
David A. Kubalak, NASA Goddard Space Flight Ctr. (United States)
Renee M. Gracey, Ball Aerospace & Technologies Corp. (United States)
Derek S. Sabatke, Ball Aerospace & Technologies Corp. (United States)
David A. Kubalak, NASA Goddard Space Flight Ctr. (United States)
Renee M. Gracey, Ball Aerospace & Technologies Corp. (United States)
Derek S. Sabatke, Ball Aerospace & Technologies Corp. (United States)
Joseph M. Howard, NASA Goddard Space Flight Ctr. (United States)
Randal C. Telfer, Space Telescope Science Institute (United States)
Thomas P. Zielinski, NASA Goddard Space Flight Ctr. (United States)
Randal C. Telfer, Space Telescope Science Institute (United States)
Thomas P. Zielinski, NASA Goddard Space Flight Ctr. (United States)
Published in SPIE Proceedings Vol. 9951:
Optical System Alignment, Tolerancing, and Verification X
José Sasián; Richard N. Youngworth, Editor(s)
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