Share Email Print

Proceedings Paper

Linking Rayleigh-Rice theory with near linear shift invariance in light scattering phenomena
Author(s): John C. Stover; Sven Schroeder; Chris Staats; Vladimir Lopushenko; Eugene Church
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Understanding topographic scatter has been the subject of many publications. For optically smooth surfaces that scatter only from roughness (and not from contamination, films or bulk defects) the Rayleigh-Rice relationship resulting from a rigorous electromagnetic treatment has been successfully used for over three decades and experimentally proven at wavelengths ranging from the X-Ray to the far infrared (even to radar waves). The “holy grail” of roughness-induced scatter would be a relationship that is not limited to just optically smooth surfaces, but could be used for any surface where the material optical constants and the surface power spectral density function (PSD) are known. Just input these quantities and calculate the BRDF associated with any source incident angle, wavelength and polarization. This is an extremely challenging problem, but that has not stopped a number of attempts. An intuitive requirement on such general relationships is that they must reduce to the simple Rayleigh-Rice formula for sufficiently smooth surfaces. Unfortunately that does not always happen. Because most optically smooth surfaces also scatter from non-topographic features, doubt creeps in about the accuracy of Rayleigh-Rice. This paper investigates these issues and explains some of the confusion generated in recent years. The authors believe there are measurement issues, scatter source issues and rough surface derivation issues, but that Rayleigh- Rice is accurate as formulated and should not be “corrected.” Moreover, it will be shown that the empirically observed near shift invariance of surface scatter phenomena is a direct consequence of the Rayleigh-Rice theory.

Paper Details

Date Published: 5 October 2016
PDF: 10 pages
Proc. SPIE 9961, Reflection, Scattering, and Diffraction from Surfaces V, 996102 (5 October 2016); doi: 10.1117/12.2238567
Show Author Affiliations
John C. Stover, The Scatter Works Inc. (United States)
Sven Schroeder, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)
Chris Staats, Schmitt Measurement Systems (United States)
Vladimir Lopushenko, Moscow State Univ. (Russian Federation)
Eugene Church, Consultant (United States)

Published in SPIE Proceedings Vol. 9961:
Reflection, Scattering, and Diffraction from Surfaces V
Leonard M. Hanssen, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?