
Proceedings Paper
Effect of wavelength change in microholographic recordingFormat | Member Price | Non-Member Price |
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Paper Abstract
In microholographic recording, expensive laser diodes having no spectrum broadening (single mode) and no wavelength
variation are used. On the other hand, in conventional optical disk systems, cheap laser diodes having spectrum
broadening (multimode) and wavelength variation are used. It is a great advantage if the laser diodes for conventional
optical disk systems can be used for microholographic recording. Therefore, the effect of wavelength change in
microholographic recording was investigated through a numerical simulation. The laser diodes were modeled so that the
full width at 1/e2 maximum of the spectrum was 0.8 nm and the center wavelength was 405 nm. The numerical aperture
of the objective lenses was 0.85 and the thickness of the recording medium was 300 μm. The diffraction efficiency of the
diffracted beam from a microhologram was calculated using the coupled wave theory and the following results were
obtained. The diffraction efficiency decreased by three orders of magnitude by replacing single-mode laser diodes with
multimode laser diodes, which makes it necessary to enhance the readout signal. The tolerance of the optical path length
difference between the signal and reference beams was -50 ~ 110 μm, which makes it necessary to adjust the optical
path length difference. The tolerance of the wavelength variation was 405 ± 0.5 nm, which makes it necessary to select
the laser diodes. The conclusion was that it is not practical to use the laser diodes for conventional optical disk systems
for microholographic recording.
Paper Details
Date Published: 8 September 2016
PDF: 8 pages
Proc. SPIE 9959, Optical Data Storage 2016, 995905 (8 September 2016); doi: 10.1117/12.2238531
Published in SPIE Proceedings Vol. 9959:
Optical Data Storage 2016
Ryuichi Katayama; Thomas D. Milster, Editor(s)
PDF: 8 pages
Proc. SPIE 9959, Optical Data Storage 2016, 995905 (8 September 2016); doi: 10.1117/12.2238531
Show Author Affiliations
Ryuichi Katayama, Fukuoka Institute of Technology (Japan)
Published in SPIE Proceedings Vol. 9959:
Optical Data Storage 2016
Ryuichi Katayama; Thomas D. Milster, Editor(s)
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