Compact structure-function simulations are needed to examine interactions between confined fields and carriers at interfaces of two-dimensional materials and metal contacts. This work used electron-source discrete dipole simulations of fields confined at metals interfaced with van der Waals materials to compare with measures using scanning transmission electron microscopy (STEM) for energy electron loss spectroscopy (EELS). Bright, dark, and hybrid modes at the interface were mapped at sub-nanometer resolution at resonant energies. Comparing simulation and measurement provided direct, femtosecond measures of confined field dephasing into carriers on topologically insulated surfaces for the first time.

Date Published: 16 September 2016
PDF: 7 pages
Proc. SPIE 9924, Low-Dimensional Materials and Devices 2016, 992408 (16 September 2016); doi: 10.1117/12.2238129

Published in SPIE Proceedings Vol. 9924:
Low-Dimensional Materials and Devices 2016
Nobuhiko P. Kobayashi; A. Alec Talin; M. Saif Islam; Albert V. Davydov, Editor(s)