
Proceedings Paper
Goniometric and hemispherical reflectance and transmittance measurements of fused silica diffusersFormat | Member Price | Non-Member Price |
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Paper Abstract
Fused silica diffusers, made by forming scattering centers inside fused silica glass, can exhibit desirable optical properties,
such as reflectance or transmittance independent of viewing angle, spectrally flat response into the ultraviolet wavelength
range, and good spatial uniformity. The diffusers are of interest for terrestrial and space borne remote sensing instruments,
which use light diffusers in reflective and transmissive applications. In this work, we report exploratory measurements of
two samples of fused silica diffusers. We will present goniometric bidirectional scattering distribution function (BSDF)
measurements under normal illumination provided by the National Institute of Standards and Technology (NIST)’s
Goniometric Optical Scatter Instrument (GOSI), by NIST’s Infrared reference integrating sphere (IRIS) and by the
National Aeronautics and Space Administration (NASA)’s Diffuser Calibration Laboratory. We also present
hemispherical diffuse transmittance and reflectance measurements provided by NIST’s Double integrating sphere Optical
Scattering Instrument (DOSI). The data from the DOSI is analyzed by Prahl’s inverse adding-doubling algorithm to obtain
the absorption and reduced scattering coefficient of the samples. Implications of fused silica diffusers for remote sensing
applications are discussed.
Paper Details
Date Published: 11 October 2016
PDF: 12 pages
Proc. SPIE 9961, Reflection, Scattering, and Diffraction from Surfaces V, 996109 (11 October 2016); doi: 10.1117/12.2237975
Published in SPIE Proceedings Vol. 9961:
Reflection, Scattering, and Diffraction from Surfaces V
Leonard M. Hanssen, Editor(s)
PDF: 12 pages
Proc. SPIE 9961, Reflection, Scattering, and Diffraction from Surfaces V, 996109 (11 October 2016); doi: 10.1117/12.2237975
Show Author Affiliations
Paul Lemaillet, National Institute of Standards and Technology (United States)
Heather J. Patrick, National Institute of Standards and Technology (United States)
Thomas A. Germer, National Institute of Standards and Technology (United States)
Heather J. Patrick, National Institute of Standards and Technology (United States)
Thomas A. Germer, National Institute of Standards and Technology (United States)
Leonard Hanssen, National Institute of Standards and Technology (United States)
B. Carol Johnson, National Institute of Standards and Technology (United States)
Georgi T. Georgiev, NASA Goddard Space Flight Ctr. (United States)
Science Systems and Applications, Inc. (United States)
B. Carol Johnson, National Institute of Standards and Technology (United States)
Georgi T. Georgiev, NASA Goddard Space Flight Ctr. (United States)
Science Systems and Applications, Inc. (United States)
Published in SPIE Proceedings Vol. 9961:
Reflection, Scattering, and Diffraction from Surfaces V
Leonard M. Hanssen, Editor(s)
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