Share Email Print

Proceedings Paper

Enhancing spatial resolution for spectral uCT with aperture encoding
Author(s): Matthew Getzin; Tianyu Liu; Qingsong Yang; Mianyi Chen; Wenxiang Cong; George Xu; Ge Wang
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Recent advances in X-ray imaging technologies have paved the way for use of energy-discriminating photon-counting detector arrays. These detectors show promise in clinical and preclinical applications. Multi-energy or spectral CT images can be visualized in multi-colors. Despite the advantages offered by the spectral dimension of acquired data, higher image resolution is still desirable, especially in challenging tasks such as on-site studies of resected pathological tissues. Here we propose to enhance image resolution of a spectral X-ray imaging system by partially blocking each detector element with an absorption grating (for reduced aperture), commonly used for Talbot-Lau interferometry. After acquiring X-ray data at an initial grating-detector configuration, the grating is shifted to expose previously blocked portions so that each measurement contains new information. All the acquired data are then combined into an augmented system matrix and subsequently reconstructed using an iterative algorithm. Our proof of concept simulations are performed with MCNP6.1 code and the experiment was performed using a Hamamatsu microfocus X-ray source, an absorption grating, and an Xray camera. Our results demonstrate that the gratings commonly used for x-ray phase-contrast imaging have a utility for super-resolution imaging performance.

Paper Details

Date Published: 20 September 2016
PDF: 11 pages
Proc. SPIE 9967, Developments in X-Ray Tomography X, 99670W (20 September 2016); doi: 10.1117/12.2237840
Show Author Affiliations
Matthew Getzin, Rensselaer Polytechnic Institute (United States)
Tianyu Liu, Rensselaer Polytechnic Institute (United States)
Qingsong Yang, Rensselaer Polytechnic Institute (United States)
Mianyi Chen, Rensselaer Polytechnic Institute (United States)
Chongqing Univ. (China)
Wenxiang Cong, Rensselaer Polytechnic Institute (United States)
George Xu, Rensselaer Polytechnic Institute (United States)
Ge Wang, Rensselaer Polytechnic Institute (United States)

Published in SPIE Proceedings Vol. 9967:
Developments in X-Ray Tomography X
Stuart R. Stock; Bert Müller; Ge Wang, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?