
Proceedings Paper
Development of micro-tomography system for materials science at SPring-8Format | Member Price | Non-Member Price |
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Paper Abstract
A new micro-tomography system for materials science has been developed at BL20B2 in SPring-8. The system enables us
to do stretching, press and twist of materials with a translation stage and two precise rotation stages arranged opposite to
each other. Each deformation can be operated with constant moving rate. The maximum load is about 2 kN because of the
hardness of the precision stages. The X-ray image detector consists of visible light conversion system and sCMOS camera.
The effective pixel size is variable by changing a tandem lens between 2.7 μm/pixel to 13.2 μm /pixel discretely. As a
demonstration of the system, a viscoelastic object was imaged. The experimental conditions are follows, X-ray energy: 25
keV, exposure time: 5 msec, number of projections: 900, single scan time: 7.5 sec, pixel size: 13.2 μm /pixel and field of
view: 27.0 mm x 3.9 mm. The stretching rate was 1 μm /sec to 5 μm /sec. A metastable state such as tensile loading of
viscoelastic materials is possible with this system.
Paper Details
Date Published: 3 October 2016
PDF: 7 pages
Proc. SPIE 9967, Developments in X-Ray Tomography X, 99670V (3 October 2016); doi: 10.1117/12.2237587
Published in SPIE Proceedings Vol. 9967:
Developments in X-Ray Tomography X
Stuart R. Stock; Bert Müller; Ge Wang, Editor(s)
PDF: 7 pages
Proc. SPIE 9967, Developments in X-Ray Tomography X, 99670V (3 October 2016); doi: 10.1117/12.2237587
Show Author Affiliations
Kentaro Uesugi, Japan Synchrotron Radiation Research Institute (Japan)
Masato Hoshinio, Japan Synchrotron Radiation Research Institute (Japan)
Masato Hoshinio, Japan Synchrotron Radiation Research Institute (Japan)
Hiroyuki Kishimoto, Sumitomo Rubber Industries, Ltd. (Japan)
Ryo Mashita, Sumitomo Rubber Industries, Ltd. (Japan)
Ryo Mashita, Sumitomo Rubber Industries, Ltd. (Japan)
Published in SPIE Proceedings Vol. 9967:
Developments in X-Ray Tomography X
Stuart R. Stock; Bert Müller; Ge Wang, Editor(s)
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