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Proceedings Paper

X-ray phase scanning setup for non-destructive testing using Talbot-Lau interferometer
Author(s): S. Bachche; M. Nonoguchi; K. Kato; M. Kageyama; T. Koike; M. Kuribayashi; A. Momose
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Paper Abstract

X-ray grating interferometry has a great potential for X-ray phase imaging over conventional X-ray absorption imaging which does not provide significant contrast for weakly absorbing objects and soft biological tissues. X-ray Talbot and Talbot-Lau interferometers which are composed of transmission gratings and measure the differential X-ray phase shifts have gained popularity because they operate with polychromatic beams. In X-ray radiography, especially for nondestructive testing in industrial applications, the feasibility of continuous sample scanning is not yet completely revealed. A scanning setup is frequently advantageous when compared to a direct 2D static image acquisition in terms of field of view, exposure time, illuminating radiation, etc. This paper demonstrates an efficient scanning setup for grating-based Xray phase imaging using laboratory-based X-ray source. An apparatus consisting of an X-ray source that emits X-rays vertically, optical gratings and a photon-counting detector was used with which continuously moving objects across the field of view as that of conveyor belt system can be imaged. The imaging performance of phase scanner was tested by scanning a long continuous moving sample at a speed of 5 mm/s and absorption, differential-phase and visibility images were generated by processing non-uniform moire movie with our specially designed phase measurement algorithm. A brief discussion on the feasibility of phase scanner with scanning setup approach including X-ray phase imaging performance is reported. The successful results suggest a breakthrough for scanning objects those are moving continuously on conveyor belt system non-destructively using the scheme of X-ray phase imaging.

Paper Details

Date Published: 16 September 2016
PDF: 9 pages
Proc. SPIE 9964, Advances in Laboratory-based X-Ray Sources, Optics, and Applications V, 99640F (16 September 2016); doi: 10.1117/12.2237543
Show Author Affiliations
S. Bachche, Tohoku Univ. (Japan)
M. Nonoguchi, Rigaku Corp. (Japan)
K. Kato, Rigaku Corp. (Japan)
M. Kageyama, Rigaku Corp. (Japan)
T. Koike, Rigaku Corp. (Japan)
M. Kuribayashi, Rigaku Corp. (Japan)
A. Momose, Tohoku Univ. (Japan)

Published in SPIE Proceedings Vol. 9964:
Advances in Laboratory-based X-Ray Sources, Optics, and Applications V
Ali M. Khounsary; Gert E. van Dorssen, Editor(s)

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