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Proceedings Paper

Pyroelectric response of spray-deposited BaTiO3 thin film
Author(s): Robert E. Peale; Isaiah O. Oladeji; Evan M. Smith; Vladimir Vasilyev; Sarmad Fawzi Hamza Alhasan; Hussain Abouelkhair; Dalibor Todorovski; Martin Kimani; Justin W. Cleary
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Paper Abstract

Pyroelectric photoresponse of aqueous spray deposited thin films containing BaTiO3 nano-crystals is reported. X-ray diffraction data indicate the presence of hexagonal BaTiO3 nano-crystals with ~20 nm crystalline domains in a matrix of some as yet unidentified nano-crystalline material. When the film is annealed at 600 C, the X-ray pattern changes significantly and indicates a conversion to one of the non-hexagonal phases of BaTiO3 as well as a complete change in the matrix. With suitable amplifier, the measured photoresponse was 40V/W. Ferroelectric hysteresis on a film with significant presence of hexagonal BaTiO3 shows saturated polarization which is about 5-times smaller than for the bulk tetragonal phase. A potential application is a patternable infrared detector for photonic and plasmonic devices, such as chip-scale spectral sensors.

Paper Details

Date Published: 26 September 2016
PDF: 7 pages
Proc. SPIE 9929, Nanostructured Thin Films IX, 99290Z (26 September 2016); doi: 10.1117/12.2237458
Show Author Affiliations
Robert E. Peale, Univ. of Central Florida (United States)
Isaiah O. Oladeji, SISOM Thin Films LLC (United States)
Evan M. Smith, Wyle Labs., Inc. (United States)
Air Force Research Lab. (United States)
Vladimir Vasilyev, Air Force Research Lab. (United States)
Sarmad Fawzi Hamza Alhasan, Univ. of Central Florida (United States)
Univ. of Techonology (Iraq)
Hussain Abouelkhair, Univ. of Central Florida (United States)
Dalibor Todorovski, Univ. of Central Florida (United States)
Martin Kimani, Wyle Labs., Inc. (United States)
Air Force Research Lab. (United States)
Justin W. Cleary, Air Force Research Lab. (United States)

Published in SPIE Proceedings Vol. 9929:
Nanostructured Thin Films IX
Akhlesh Lakhtakia; Tom G. Mackay; Motofumi Suzuki, Editor(s)

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