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Proceedings Paper

Activities of the task group 8 on thin film PV module reliability (Conference Presentation)
Author(s): Neelkanth G. Dhere

Paper Abstract

Photovoltaic (PV) modules and systems are being used increasingly to provide renewable energy to schools, residences, small businesses and utilities. At this time, the home owners and small businesses have considerable difficulty in detecting module and/or system degradation and especially enforcing warranty. It needs to be noted that IEC 61215-1 (test req.), -2 (test proc.) and -1-1 (c-Si) are forecasted to be circulated end of Feb 2016 and only editorial changes would be possible. 61215 series does include thin film technologies and would be replacing 61646. Moreover, IEC 61215-1, section 7.2 power output and electric circuitry does contain significant changes to acceptance criteria regarding rated label values, particularly rated power. Even though it is believed that consensus could be achieved within IEC TC82 WG2, some of the smaller players that do not participate actively in IEC TC82 – may not be surprised and must be informed. The other tech specific parts 61215-1-2 (CdTe), -1-3 (a-Si, µc-Si) and -1-4 (CIS, CIGS) are out for comments. The IEC closing date was January 29, 2016. The additions alternative damp heat (DH) test proposed Solar Frontier is being reviewed. In the past, only 600 V systems were permitted in the grid-connected residential and commercial systems in the US. The US commercial systems can now use higher voltage (1,000-1500V) in order to reduce BOS component costs. It is believed that there would not be any problems. The Task Group 8 is collecting data on higher voltage systems.

Paper Details

Date Published: 2 November 2016
PDF: 1 pages
Proc. SPIE 9938, Reliability of Photovoltaic Cells, Modules, Components, and Systems IX, 99380B (2 November 2016); doi: 10.1117/12.2237449
Show Author Affiliations
Neelkanth G. Dhere, Univ. of Central Florida (United States)

Published in SPIE Proceedings Vol. 9938:
Reliability of Photovoltaic Cells, Modules, Components, and Systems IX
Neelkanth G. Dhere; John H. Wohlgemuth; Keiichiro Sakurai, Editor(s)

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