
Proceedings Paper
Analysis of a shearography device using a Wollaston prism and polarization phase shiftingFormat | Member Price | Non-Member Price |
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Paper Abstract
Speckle shear interferometry, or shearography, has been more and more frequently used in the industry for in-field
nondestructive inspections of flaws in composite materials used in the aerospace and oil and gas industry. Nowadays
new applications has emerged demanding the ability to operate in harsher environments. Bringing interferometric
systems to harsh environments is not an easy task since they are very sensitive to many harsh environmental factors. Due
to the quasi-equal-path property, shearography is an intrinsically robust interferometric technique that has been
successfully used in the field, but there are still limits to overcome. Mechanical vibrations are probably the most
challenging factor to cope in the field measurements. This work presents a potentially robust shear interferometer
configuration. It uses a Wollaston prism as the shearing element rather than a traditional Michelson interferometer and
polarizers to achieve the phase shift. The use of the Wollaston prism makes the optical setup more compact and robust,
given that a rotating polarizer is the only movable part of the interferometer.
Paper Details
Date Published: 28 August 2016
PDF: 6 pages
Proc. SPIE 9960, Interferometry XVIII, 996015 (28 August 2016); doi: 10.1117/12.2237395
Published in SPIE Proceedings Vol. 9960:
Interferometry XVIII
Katherine Creath; Jan Burke; Armando Albertazzi Gonçalves Jr., Editor(s)
PDF: 6 pages
Proc. SPIE 9960, Interferometry XVIII, 996015 (28 August 2016); doi: 10.1117/12.2237395
Show Author Affiliations
E. Sanchez, Univ. Federal de Santa Catarina (Brazil)
M. E. Benedet, Univ. Federal de Santa Catarina (Brazil)
D. P. Willemann, Univ. Federal de Santa Catarina (Brazil)
M. E. Benedet, Univ. Federal de Santa Catarina (Brazil)
D. P. Willemann, Univ. Federal de Santa Catarina (Brazil)
A. V. Fantin, Univ. Federal de Santa Catarina (Brazil)
A. G. Albertazzi Jr., Univ. Federal de Santa Catarina (Brazil)
A. G. Albertazzi Jr., Univ. Federal de Santa Catarina (Brazil)
Published in SPIE Proceedings Vol. 9960:
Interferometry XVIII
Katherine Creath; Jan Burke; Armando Albertazzi Gonçalves Jr., Editor(s)
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