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Proceedings Paper

Ultrafast electron microscopy for investigating fundamental physics phenomena
Author(s): Prawesh Dahal; Akrit Mudvari; Aashwin Basnet; Parker W. Brown; Brett Barwick
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Paper Abstract

Recent experiments have shown that by combining a femtosecond laser with an electron microscope, dynamics at the nanoscale with femtosecond temporal resolution can be followed. These ultrafast electron microscopy (UEM) techniques have allowed a variety of experimental studies on nanoscale material systems to be conducted, including the ability to image plasmon dynamics in real time. We will discuss how UEM can also be used to study fundamental quantum problems, present some recent experimental results and we will discuss how future experimental improvements will push the temporal resolution from hundreds of femtoseconds down to the single femtosecond regime and below.

Paper Details

Date Published: 3 October 2016
PDF: 7 pages
Proc. SPIE 9956, Ultrafast Nonlinear Imaging and Spectroscopy IV, 995604 (3 October 2016); doi: 10.1117/12.2237392
Show Author Affiliations
Prawesh Dahal, Trinity College (United States)
Akrit Mudvari, Trinity College (United States)
Aashwin Basnet, Trinity College (United States)
Parker W. Brown, Trinity College (United States)
Brett Barwick, Trinity College (United States)

Published in SPIE Proceedings Vol. 9956:
Ultrafast Nonlinear Imaging and Spectroscopy IV
Zhiwen Liu, Editor(s)

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