Share Email Print

Proceedings Paper

Single-shot adaptive measurement for quantum-enhanced metrology
Author(s): Pantita Palittpongarnpim; Peter Wittek; Barry C. Sanders
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Quantum-enhanced metrology aims to estimate an unknown parameter such that the precision scales better than the shot-noise bound. Single-shot adaptive quantum-enhanced metrology (AQEM) is a promising approach that uses feedback to tweak the quantum process according to previous measurement outcomes. Techniques and formalism for the adaptive case are quite different from the usual non-adaptive quantum metrology approach due to the causal relationship between measurements and outcomes. We construct a formal framework for AQEM by modeling the procedure as a decision-making process, and we derive the imprecision and the Cram´er- Rao lower bound with explicit dependence on the feedback policy. We also explain the reinforcement learning approach for generating quantum control policies, which is adopted due to the optimal policy being non-trivial to devise. Applying a learning algorithm based on differential evolution enables us to attain imprecision for adaptive interferometric phase estimation, which turns out to be SQL when non-entangled particles are used in the scheme.

Paper Details

Date Published: 13 September 2016
PDF: 11 pages
Proc. SPIE 9980, Quantum Communications and Quantum Imaging XIV, 99800H (13 September 2016); doi: 10.1117/12.2237355
Show Author Affiliations
Pantita Palittpongarnpim, Univ. of Calgary (Canada)
Peter Wittek, ICFO - Institut de Ciències Fotòniques (Spain)
Univ. of Boras (Sweden)
Barry C. Sanders, Univ. of Calgary (Canada)
Canadian Institute for Advanced Research (Canada)
Univ. of Science and Technology of China (China)

Published in SPIE Proceedings Vol. 9980:
Quantum Communications and Quantum Imaging XIV
Ronald E. Meyers; Yanhua Shih; Keith S. Deacon, Editor(s)

© SPIE. Terms of Use
Back to Top