
Proceedings Paper
Polarization characterization of liquid-crystal variable retardersFormat | Member Price | Non-Member Price |
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Paper Abstract
A comparison between two experimental techniques to characterize retardance as a function of applied voltage of liquid
crystal variable retarders (LCVR) is presented. In the first method the variable retarder was rotated between two
polarizers with their transmission axes parallel, and the retardance was calculated from the Fourier series coefficients for
each applied voltage. The second method involved using two polarizers with their transmission axes perpendicular to
each other, the variable retarder was placed between the polarizers with its optical axis at 45° from the horizontal, and a
final stage known as "phase unwrapping" is used on experimental data to obtain the voltage-retardance function. With
these two experimental methods, the voltage-retardance relationship was obtained.
To verify the accuracy of this characterization a second experiment involving the production of specific polarization
states was performed as the basis of a Mueller polarimeter. A method based on measuring the optical signal resulting
from the application of a predetermined set of fixed values of retardance in each retarder was used. 16 elements of the
Mueller matrix of a polarizer with its transmission axis at 0° and 90° were measured, and the results are compared to the
expected theoretical values.
Paper Details
Date Published: 28 August 2016
PDF: 11 pages
Proc. SPIE 9960, Interferometry XVIII, 996014 (28 August 2016); doi: 10.1117/12.2237087
Published in SPIE Proceedings Vol. 9960:
Interferometry XVIII
Katherine Creath; Jan Burke; Armando Albertazzi Gonçalves Jr., Editor(s)
PDF: 11 pages
Proc. SPIE 9960, Interferometry XVIII, 996014 (28 August 2016); doi: 10.1117/12.2237087
Show Author Affiliations
Iván Montes, Univ. Nacional Autónoma de México (Mexico)
Neil C. Bruce, Univ. Nacional Autónoma de México (Mexico)
Neil C. Bruce, Univ. Nacional Autónoma de México (Mexico)
Juan M. López-Téllez, Univ. Nacional Autónoma de México (Mexico)
Published in SPIE Proceedings Vol. 9960:
Interferometry XVIII
Katherine Creath; Jan Burke; Armando Albertazzi Gonçalves Jr., Editor(s)
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