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Proceedings Paper

Adaptive grating interferometric sensor for NDE metrology in high energy electromagnetic environment
Author(s): George Dovgalenko; Kadir Altintepe; Michael Bodnar; Joseph Prokop
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Paper Abstract

CCD cameras and CMOS devices are the major electronic components of industrial metrology, which are vulnerable to high level electromagnetic exposure. Typical sources of exposure of electronics to ionizing radiation are the Van Allen radiation belts for satellites, nuclear reactors in power plants for sensors and control circuits, particle accelerators for control electronics particularly particle detector devices, residual radiation from isotopes in chip packaging materials, cosmic radiation for spacecraft and highaltitude aircraft, and nuclear explosions for potentially all military and civilian electronics. A total dose 5 ×103 rad was delivered to silicon-based devices in seconds to minutes caused long-term degradation. We demonstrated adaptive grating, 3D image sensor for NDE metrology which is non vulnerable for high level X-Ray1 and 3 × 106 rad gamma radiation exposure. Sensor is based on adaptive holographic grating generated by 632.8 nm He-Ne laser - in doped electro optic Bismuth Titanate (BTO) monocrystal. Mathematical algorithm of bipolar model conductivity in BTO crystal has been applied for experimental analyses. Applications of proposed sensor for airspace, military, nuclear and civil engineering industries have been discussed.

Paper Details

Date Published: 28 August 2016
PDF: 10 pages
Proc. SPIE 9960, Interferometry XVIII, 99600V (28 August 2016); doi: 10.1117/12.2236980
Show Author Affiliations
George Dovgalenko, Thomas Nelson Community College (United States)
Advanced Sensor Technology Inc. (United States)
Kadir Altintepe, Thomas Nelson Community College (United States)
Michael Bodnar, TESLA Blatná, a.s. (Czech Republic)
Joseph Prokop, ATG s.r.o. (Czech Republic)

Published in SPIE Proceedings Vol. 9960:
Interferometry XVIII
Katherine Creath; Jan Burke; Armando Albertazzi Gonçalves Jr., Editor(s)

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