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Proceedings Paper

Raman studies for stockpile reliability of missiles by detecting degradation of propellant stabilizers
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Paper Abstract

The objective of this study is to demonstrate a sensitive Raman technique for sensing degradation of propellant stabilizers like MNA and 2-NDPA that are commonly used in some missiles. The functionality of missiles and rockets are often evaluated by being fired or decomposed at routine time-intervals after prolonged storage. However, these destructive testing techniques for determining long-term rocket motor aging and shelf-life are extremely costly. If successful, the Raman technique could be utilized to determine the health of propellant stabilizers without dismantling the missiles as is commonly done at present. Raman technique is to measure concentrations of propellant stabilizers between 0.1-2% in glycerin. Two different lasers at 785 nm and 532 nm are used for developing this technique. A secondary objective is to develop a theoretical model that predicts temperature as a function of time and position inside the cylindrical storage container of MNA or 2-NDPA stabilizer. This model can help in understanding the thermal degradation of propellant stabilizers.

Paper Details

Date Published: 7 September 2016
PDF: 7 pages
Proc. SPIE 9958, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X, 99580P (7 September 2016); doi: 10.1117/12.2236331
Show Author Affiliations
Carlton Farley, Alabama A&M Univ. (United States)
Aschalew Kassu, Alabama A&M Univ. (United States)
Jonathan Mills, Alabama A&M Univ. (United States)
Jonathan Bibb, Alabama A&M Univ. (United States)
Michael Curley, Alabama A&M Univ. (United States)
Paul Ruffin, Alabama A&M Univ. (United States)
Anup Sharma, Alabama A&M Univ. (United States)
Jeremy Rice, US Army AMRDEC (United States)
Brian McDonald, US Army AMRDEC (United States)


Published in SPIE Proceedings Vol. 9958:
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X
Shizhuo Yin; Ruyan Guo, Editor(s)

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