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Proceedings Paper

Birefringent coherent diffraction imaging
Author(s): Dmitry Karpov; Tomy dos Santos Rolo; Hannah Rich; Yuriy Kryuchkov; Boris Kiefer; E. Fohtung
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Paper Abstract

Directional dependence of the index of refraction contains a wealth of information about anisotropic optical properties in semiconducting and insulating materials. Here we present a novel high-resolution lens-less technique that uses birefringence as a contrast mechanism to map the index of refraction and dielectric permittivity in optically anisotropic materials. We applied this approach successfully to a liquid crystal polymer film using polarized light from helium neon laser. This approach is scalable to imaging with diffraction-limited resolution, a prospect rapidly becoming a reality in view of emergent brilliant X-ray sources. Applications of this novel imaging technique are in disruptive technologies, including novel electronic devices, in which both charge and spin carry information as in multiferroic materials and photonic materials such as light modulators and optical storage.

Paper Details

Date Published: 4 November 2016
PDF: 16 pages
Proc. SPIE 9931, Spintronics IX, 99312F (4 November 2016); doi: 10.1117/12.2235865
Show Author Affiliations
Dmitry Karpov, New Mexico State Univ. (United States)
Tomsk Polytechnic Univ. (Russian Federation)
Tomy dos Santos Rolo, Karlsruhe Institute of Technology (Germany)
Hannah Rich, New Mexico State Univ. (United States)
Yuriy Kryuchkov, Tomsk Polytechnic Univ. (Russian Federation)
Boris Kiefer, New Mexico State Univ. (United States)
E. Fohtung, New Mexico State Univ. (United States)
Los Alamos National Lab. (United States)

Published in SPIE Proceedings Vol. 9931:
Spintronics IX
Henri-Jean Drouhin; Jean-Eric Wegrowe; Manijeh Razeghi, Editor(s)

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